Transient effects on high voltage diode stack under reverse bias
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2003
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(03)00028-3